000 | 00400nam a2200145Ia 4500 | ||
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999 |
_c72228 _d72228 |
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005 | 20230601155928.0 | ||
008 | 180710s9999 xx 000 0 und d | ||
082 |
_a669.9 _bTOL _223 |
||
100 | _aTOLANSKY, S. | ||
245 |
_aMultiple-beam interference microscopy of metals _c/[by]S.Tolansky |
||
260 |
_aLondon _bAcademic press _c1970 |
||
300 | _aix, 146 p. | ||
500 | _aIncludes index. | ||
942 | _cS |