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_a621.395 _bVLS _223 |
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| 245 |
_aVlsi testing _c/ edited by T.W.Williams |
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| 260 |
_aOxford _bElsevier Science pub. _c1986 |
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| 300 | _aix, 275 p. | ||
| 509 | _aNS | ||
| 700 |
_9149197 _aWilliams, T.W. _eedt |
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| 942 | _cR | ||