| 000 | 00673nam a2200229Ia 4500 | ||
|---|---|---|---|
| 999 |
_c36521 _d36521 |
||
| 005 | 20220121142506.0 | ||
| 008 | 180712s9999 xx 000 0 und d | ||
| 020 | _a471241393 | ||
| 041 | _aEN | ||
| 082 |
_a621.38152 _bSCH _223 |
||
| 100 | _aSchroder,Dieter K. | ||
| 245 |
_aSemiconductor material and device characterization / _c[by] Dieter K.Schroder |
||
| 250 | _a2nd ed. | ||
| 260 |
_aNew York _bJohn-Wiley & Sons _c1998 |
||
| 300 | _axxiv, 760 p.- | ||
| 440 | _aA Wiley-Interscience publication | ||
| 500 | _aIncludes appendixes, references and index. | ||
| 509 | _aNS | ||
| 650 | _aSemiconductors | ||
| 650 | 0 |
_a Semiconductors-Testing _9103119 |
|
| 942 | _cR | ||