000 | 00587nam a2200193Ia 4500 | ||
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999 |
_c2256 _d2256 |
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005 | 20230921100934.0 | ||
008 | 180712s9999 xx 000 0 und d | ||
020 | _a9780199213245 | ||
082 |
_a620.11272 _bADV _223 |
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100 | _aBanhart, John., ed. | ||
245 |
_aADVANCED tomographic methods in materials research and engineering _c/ (ed. by) John Banhart |
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260 |
_aOxford _bOxford University Press _c2008 |
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300 | _axxv, 462 p. | ||
500 | _aIncludes appendix and index | ||
509 | _aNS | ||
650 | _aRadiographic testing | ||
700 |
_926979 _aBanhart, John., ed. |
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942 | _cR |