000 00385nam a22001217a 4500
999 _c185785
_d185784
005 20241230090309.0
008 241230b ||||| |||| 00| 0 eng d
020 _a8120322142
100 _aChakraborty,[et.al]
245 _aFault - Tolerance and Rellability Techniques for High - Density Random - Access Memories
260 _aNew Delhi
_bPrentice - Hall
_c2002
300 _axix, 426 p.