| 000 | 00742nam a2200229Ia 4500 | ||
|---|---|---|---|
| 999 |
_c17267 _d17267 |
||
| 005 | 20221108154917.0 | ||
| 008 | 180712s9999 xx 000 0 und d | ||
| 020 | _a9780387095783 | ||
| 082 |
_a548.83 _bPEC _223 |
||
| 100 | _aPECHARSKY, Vitalij K. | ||
| 245 |
_aFundamentals of powder diffraction and structural characterization of materials / _cVitalij K. Pecharsky, Peter Y. Zavalij |
||
| 250 | _a2nd ed. | ||
| 260 |
_aNew York _bSpringer _c2009 |
||
| 300 | _axxiii, 741 p. | ||
| 500 | _aIncludes index | ||
| 509 | _aNS | ||
| 650 | _aX-rays- Diffraction- Measurement | ||
| 650 | 0 |
_aPowders-optical propertions- Measurement _9143425 |
|
| 650 | 0 |
_a X-ray crystallography _9131978 |
|
| 700 |
_9143424 _aZavalij , Peter Y. |
||
| 942 | _cR | ||