Schroder,Dieter K. <br/><br/>
Semiconductor material and device characterization / 
[by] Dieter K.Schroder 
 - 2nd ed. 
 - New York  John-Wiley & Sons  1998 
 - xxiv, 760 p.- 
 - A Wiley-Interscience publication .
<br/><br/> Includes appendixes, references and index. 
<br/><br/><label>ISBN: </label>471241393 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors<br/> Semiconductors-Testing
<br/><br/><label>Dewey Class. No.: </label>621.38152  / SCH