Normal view MARC view ISBD view

Field ion microscopy: principles and applications / [by] Erwin W.Muller, Tien Tzou Tsong

Publisher: New York American Elsevier pub. 1969Description: v, 314 p.DDC classification: 537.56

Tags from this library: No tags from this library for this title. Log in to add tags.

average rating: 0.0 (0 votes)

Item type	Current location	Call number	Status	Date due	Barcode
Books in Stacks (S)	Main Library Science & Technology	537.56 MUL (Browse shelf)	Available		55476

Previous	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	No cover image available	Next
Previous	537.56 AND The discovery of the electron: the development of the atomic concept of electric	537.56 CRO Ions.electrons, and ionizing radiations /	537.56 KLE Electronic optics	537.56 MUL Field ion microscopy: principles and applications /	537.56 YAR Introduction to optical electronics	537.56 YAR Introduction to optical electronics	537.56 ZHI Electron optics and electron-bem devices /	Next

Includes index.

There are no comments for this item.

UOJ Online