Normal view MARC view ISBD view

Analog signal generation for built in self test of mixed signal integrated circuits / by Gordon W. Robrts, Albert K. Lu

By: Robrts, Gordon W | K. Lu, Albert.
Publisher: Boston Kluwer academic 1995Description: viii, 122 p.ISBN: 136412.DDC classification: 621.3815
Tags from this library: No tags from this library for this title. Log in to add tags.
    average rating: 0.0 (0 votes)

Includes index

There are no comments for this item.

Log in to your account to post a comment.
© University of Jaffna