Semiconductor material and device characterization / [by] Dieter K.Schroder
By: Schroder,Dieter K.
Series: A Wiley-Interscience publication. Publisher: New York John-Wiley & Sons 1998Edition: 2nd ed.Description: xxiv, 760 p.-.ISBN: 471241393.Subject(s): Semiconductors | Semiconductors-Testing
DDC classification: 621.38152
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Includes appendixes, references and index.
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