ADVANCED tomographic methods in materials research and engineering / (ed. by) John Banhart
By: Banhart, John., ed.
Contributor(s): Banhart, John., ed.
Publisher: Oxford Oxford University Press 2008Description: xxv, 462 p.ISBN: 9780199213245.Subject(s): Radiographic testingDDC classification: 620.11272Item type | Current location | Collection | Call number | Status | Date due | Barcode |
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Books in Reference (R) | Technology Library General Section | R | 620.11272 ADV (Browse shelf) | Available | 253876 |
Includes appendix and index
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