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ADVANCED tomographic methods in materials research and engineering / (ed. by) John Banhart

By: Banhart, John., ed.
Contributor(s): Banhart, John., ed.
Publisher: Oxford Oxford University Press 2008Description: xxv, 462 p.ISBN: 9780199213245.Subject(s): Radiographic testingDDC classification: 620.11272
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Books in Reference (R) Books in Reference (R) Technology Library
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R 620.11272 ADV (Browse shelf) Available 253876

Includes appendix and index

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